Results are delivered by email approximately 10-14 days from the time samples are received.

The analysis utilizes Scanning Electron Microscopy (SEM) and Energy Dispersive Radiation to review both the geometry and elemental makeup of the sample. The analysis is able to distinguish between simple tin particles, common to almost all tin plated materials, and the dangerous tin whiskers.

The test is intended to confirm the presence of Tin Whiskers at the time and location the sample is collected. Whiskers could be growing on other components, not tested. And an object that shows no signs of Tin Whiskers could grow whiskers later.

Click here for more information about Tin Whiskers.